Electron correlation decides the stability of cubic versus hexagonal boron nitride
نویسندگان
چکیده
منابع مشابه
Infrared ellipsometry on hexagonal and cubic boron nitride thin films
Infrared ellipsometry on hexagonal and cubic boron nitride thin films" (1997).
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We measured firstand second-order Raman scattering in cubic and hexagonal boron nitride using excitation energies in the visible and in the UV. The nonresonant first-order Raman susceptibilities for cubic and hexagonal BN are 1 and 10 Å2, respectively. Raman scattering is thus very powerful in detecting the hexagonal phase in mixed thin boron nitride films. In cubic BN the constant Raman sucsep...
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Multislice simulations in the transmission electron microscope (TEM) were used to examine changes in annular-dark-field scanning TEM (ADF-STEM) images, conventional bright-field TEM (BF-CTEM) images, and selected-area electron diffraction (SAED) patterns as atomically thin hexagonal boron nitride (h-BN) samples are tilted up to 500 mrad off of the [0001] zone axis. For monolayer h-BN the contra...
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J. Kotakoski,1 C. H. Jin,2,3 O. Lehtinen,1 K. Suenaga,2 and A. V. Krasheninnikov1,4 1Materials Physics Division, University of Helsinki, P.O. Box 43, 00014 Helsinki, Finland 2Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565, Japan 3Department of Materials Science and Engineering, Meijo University, Tenpaku-ku, Nagoya 468-8502, Ja...
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ژورنال
عنوان ژورنال: Physical Review B
سال: 2011
ISSN: 1098-0121,1550-235X
DOI: 10.1103/physrevb.83.035117